Detection Channels
The 32:128 channel configuration offers comprehensive testing
capabilities including phased array detection, total focusing
method imaging, simultaneous TOFD and phased array scanning, dual
array probe support, dual-channel TOFD detection, and dual-channel
conventional testing to meet diverse customer requirements.
Phased Array Modules
Specialized modules include: butt weld inspection, crankshaft
inspection, pipeline corrosion detection, rail weld inspection, rim
and axle inspection, bolt inspection, TKY inspection, and other
application-specific modules.
TOFD Module
Features process parameter configuration and probe wedge parameter
settings. Automatically calculates coverage area parameters based
on probe and process parameters, including PCS (Probe Center
Separation), scanning surface coverage, back-wall coverage, and
beam angle calculations.
Conventional Module
Key functions include: A-scan waveform display; gate range,
horizontal, depth, and amplitude settings; sound velocity, delay,
and zero-point configuration; waveform freeze capability; DAC
(Distance Amplitude Correction) curves; automatic gain control;
pulse-echo and pitch-catch modes; pulse width and transmission
voltage adjustment; filtering options; channel parameter storage
and recall functions.
Process Design
Incorporates process simulation modeling with CAD software
compatibility for importing workpiece dimensions directly into the
instrument. Enables direct workpiece geometry recall and provides
customized inspection processes with complete turnkey solutions.
Phased Array Calibration
Supports ASME standard ACG (Angle Corrected Gain) and TCG (Time
Corrected Gain) curve compensation functions (TCG records up to 16
points), addressing energy distribution uniformity and measurement
accuracy issues in sector scanning. Features streamlined
calibration procedures for sound velocity, delay, ACG, TCG, and
encoder settings with user-friendly operation.
Image Processing
Dynamic depth focusing and smoothing functions ensure excellent
detection resolution and superior image quality for defects at
various depths. Image zoom and pan capabilities enable customized
display layouts, while gate expansion functionality allows detailed
defect observation. Supports multi-group display with up to 4
simultaneous display groups.
Structural Design
Fully sealed waterproof and dustproof construction suitable for
harsh testing environments. Comprehensive interface options include
USB 3.0 for high-speed data transfer and DisplayPort (DP) video
output convertible to HDMI for unlimited screen expansion.
Delay Precision
Nanosecond-level delay accuracy enhances phase delay precision,
significantly suppressing side lobes while improving longitudinal
and lateral beam resolution for enhanced imaging clarity.
Data Acquisition
Continuous A-scan storage, real-time rapid imaging for phased array
linear scanning, sector scanning, C-scanning, and TOFD scanning.
Total focusing method imaging with continuous data recording via
encoder or time-base triggering.
Focusing Laws
Automatic calculation and rapid generation based on beam angle,
focal distance, scanning mode, probe, and wedge parameters. Sector
scan angle stepping with automatic optimization.
Filters
High-pass, low-pass, and multiple narrow-band filter options. Pulse
filter bandwidth automatically optimized according to probe
frequency, showcasing advanced noise processing technology.
Display
10.4-inch industrial-grade TFT touchscreen display providing
excellent visibility in outdoor conditions and bright lighting
environments.
Power Supply
Dual AC/DC power capability with battery operation ensuring over
4.5 hours of continuous operation.
